A novel approach to the evaluation of interface roughness scattering form factor in intersubband transitions

• Autorzy: Nguyen Thanh Tien , Pham Thi Bich Thao , Le Tuan
• Języki publikacji: EN

Abstrakty

EN

We propose a modification of the interface roughness (IFR) scattering form factor in intersubband transitions.We properly derived a formula for the form factor for IFR scattering in terms of the integrals of the envelope wave functions. This novel form factor is more global nature than the old one (proposed by Ando) and may be suitable for a wide range of applications. In this paper, we calculate and compare the absorption linewidth with the application of the old form factor and novel one. In different from previous calculations, with the same surface profile (Δ, Λ), the calculation results the interface roughness scattering absorption linewidth with the application of the new form factor is greater than twice the old one. Our numerical calculations may better explain the experimental results the well-width dependence of intersubband absorption linewidth.

Słowa kluczowe

EN

Absorption linewidth; Intersubband transitions; Interface roughness scattering; Quantum well; Transition form factor

Kategorie tematyczne

• 68.35.Ct: Interface structure and roughness
• 78.67.De: Quantum wells
• 78.40.Fy: Semiconductors
• 78.30.Fs: III-V and II-VI semiconductors

• 82D80: Nanostructures and nanoparticles
• 82D37: Semiconductors

• Wydawca: De Gruyter Open
• Czasopismo: Nanoscale Systems: Mathematical Modeling, Theory and Applications
• Rocznik: 2014
• Tom: 3
• Numer: 1

Daty

otrzymano

2012-07-16

zaakceptowano

2013-11-05

online

2014-03-20

Twórcy

autor

Nguyen Thanh Tien

• College of Science, Can Tho University, 3-2 Road, Can Tho City, Vietnam

autor

Pham Thi Bich Thao

• College of Science, Can Tho University, 3-2 Road, Can Tho City, Vietnam

autor

Le Tuan

• School of Engineering Physics, Hanoi University of Science and Technology, 1 Dai Co Viet Road, Hanoi, Vietnam,

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Identyfikatory

DOI

10.2478/nsmmt-2014-0002